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authorJaret Cantu2016-08-16 18:31:48 -0400
committerFelipe Balbi2016-08-25 12:13:18 +0300
commitda605f5f842163921f851e34402da6f5829a6328 (patch)
tree2e2f2eef3a4f339a96874547d53c01ed5a817956 /CREDITS
parente51163690eaa6fd36abca2878bd6c53dcd423fd1 (diff)
usb: phy: mxs: Add DT bindings to configure TX settings
The TX settings can be calibrated for particular hardware. The phy is reset by Linux, so this cannot be handled by the bootloader. The TRM mentions that the maximum resistance should be used for the DN/DP calibration in order to pass USB certification. The values for the TX registers are poorly described in the TRM. The meanings of the register values were taken from another NXP-provided document: https://community.nxp.com/message/566147#comment-566912 Acked-by: Peter Chen <peter.chen@nxp.com> Acked-by: Rob Herring <robh@kernel.org> Signed-off-by: Jaret Cantu <jaret.cantu@timesys.com> Signed-off-by: Felipe Balbi <felipe.balbi@linux.intel.com>
Diffstat (limited to 'CREDITS')
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