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authorLinus Torvalds2018-11-18 12:21:09 -0800
committerLinus Torvalds2018-11-18 12:21:09 -0800
commit25e19c1fe421280a47f37c3571aa379e6e67966c (patch)
tree3635424070da53b33adcbd023657a6b8bcf805a5 /tools/testing
parentc67a98c00ea3c1fad14833f440fcd770232d24e7 (diff)
parent2121db09630113e67b51ae78c18115f1858f648a (diff)
Merge tag 'libnvdimm-fixes-4.20-rc3' of git://git.kernel.org/pub/scm/linux/kernel/git/nvdimm/nvdimm
Pull libnvdimm fixes from Dan Williams: "A small batch of fixes for v4.20-rc3. The overflow continuation fix addresses something that has been broken for several releases. Arguably it could wait even longer, but it's a one line fix and this finishes the last of the known address range scrub bug reports. The revert addresses a lockdep regression. The unit tests are not critical to fix, but no reason to hold this fix back. Summary: - Address Range Scrub overflow continuation handling has been broken since it was initially merged. It was only recently that error injection and platform-BIOS support enabled this corner case to be exercised. - The recent attempt to provide more isolation for the kernel Address Range Scrub state machine from userapace initiated sessions triggers a lockdep report. Revert and try again at the next merge window. - Fix a kasan reported buffer overflow in libnvdimm unit test infrastrucutre (nfit_test)" * tag 'libnvdimm-fixes-4.20-rc3' of git://git.kernel.org/pub/scm/linux/kernel/git/nvdimm/nvdimm: Revert "acpi, nfit: Further restrict userspace ARS start requests" acpi, nfit: Fix ARS overflow continuation tools/testing/nvdimm: Fix the array size for dimm devices.
Diffstat (limited to 'tools/testing')
-rw-r--r--tools/testing/nvdimm/test/nfit.c8
1 files changed, 4 insertions, 4 deletions
diff --git a/tools/testing/nvdimm/test/nfit.c b/tools/testing/nvdimm/test/nfit.c
index 9527d47a1070..01ec04bf91b5 100644
--- a/tools/testing/nvdimm/test/nfit.c
+++ b/tools/testing/nvdimm/test/nfit.c
@@ -140,8 +140,8 @@ static u32 handle[] = {
[6] = NFIT_DIMM_HANDLE(1, 0, 0, 0, 1),
};
-static unsigned long dimm_fail_cmd_flags[NUM_DCR];
-static int dimm_fail_cmd_code[NUM_DCR];
+static unsigned long dimm_fail_cmd_flags[ARRAY_SIZE(handle)];
+static int dimm_fail_cmd_code[ARRAY_SIZE(handle)];
static const struct nd_intel_smart smart_def = {
.flags = ND_INTEL_SMART_HEALTH_VALID
@@ -205,7 +205,7 @@ struct nfit_test {
unsigned long deadline;
spinlock_t lock;
} ars_state;
- struct device *dimm_dev[NUM_DCR];
+ struct device *dimm_dev[ARRAY_SIZE(handle)];
struct nd_intel_smart *smart;
struct nd_intel_smart_threshold *smart_threshold;
struct badrange badrange;
@@ -2680,7 +2680,7 @@ static int nfit_test_probe(struct platform_device *pdev)
u32 nfit_handle = __to_nfit_memdev(nfit_mem)->device_handle;
int i;
- for (i = 0; i < NUM_DCR; i++)
+ for (i = 0; i < ARRAY_SIZE(handle); i++)
if (nfit_handle == handle[i])
dev_set_drvdata(nfit_test->dimm_dev[i],
nfit_mem);