diff options
| -rw-r--r-- | Documentation/ABI/testing/sysfs-bus-iio | 18 |
1 files changed, 18 insertions, 0 deletions
diff --git a/Documentation/ABI/testing/sysfs-bus-iio b/Documentation/ABI/testing/sysfs-bus-iio index 9a70c31619ea..923070934228 100644 --- a/Documentation/ABI/testing/sysfs-bus-iio +++ b/Documentation/ABI/testing/sysfs-bus-iio @@ -661,6 +661,24 @@ Description: value is in raw device units or in processed units (as _raw and _input do on sysfs direct channel read attributes). +What: /sys/.../events/in_accel_scale +What: /sys/.../events/in_accel_peak_scale +What: /sys/.../events/in_anglvel_scale +What: /sys/.../events/in_magn_scale +What: /sys/.../events/in_rot_from_north_magnetic_scale +What: /sys/.../events/in_rot_from_north_true_scale +What: /sys/.../events/in_voltage_scale +What: /sys/.../events/in_voltage_supply_scale +What: /sys/.../events/in_temp_scale +What: /sys/.../events/in_illuminance_scale +What: /sys/.../events/in_proximity_scale +KernelVersion: 3.21 +Contact: linux-iio@vger.kernel.org +Description: + Specifies the conversion factor from the standard units + to device specific units used to set the event trigger + threshold. + What: /sys/.../events/in_accel_x_thresh_rising_hysteresis What: /sys/.../events/in_accel_x_thresh_falling_hysteresis What: /sys/.../events/in_accel_x_thresh_either_hysteresis |