From 0ee8546ac01864b6e12e65199142e00db59c9809 Mon Sep 17 00:00:00 2001 From: Srinivas Pandruvada Date: Tue, 29 Apr 2014 00:51:00 +0100 Subject: IIO: core: Modify scan element type The current scan element type uses the following format: [be|le]:[s|u]bits/storagebits[>>shift]. To specify multiple elements in this type, added a repeat value. So new format is: [be|le]:[s|u]bits/storagebitsXr[>>shift]. Here r is specifying how may times, real/storage bits are repeating. When X is value is 0 or 1, then repeat value is not used in the format, and it will be same as existing format. Signed-off-by: Srinivas Pandruvada Signed-off-by: Jonathan Cameron --- include/linux/iio/iio.h | 7 +++++++ 1 file changed, 7 insertions(+) (limited to 'include') diff --git a/include/linux/iio/iio.h b/include/linux/iio/iio.h index 5629c92eeadf..ccde91725f98 100644 --- a/include/linux/iio/iio.h +++ b/include/linux/iio/iio.h @@ -177,6 +177,12 @@ struct iio_event_spec { * shift: Shift right by this before masking out * realbits. * endianness: little or big endian + * repeat: Number of times real/storage bits + * repeats. When the repeat element is + * more than 1, then the type element in + * sysfs will show a repeat value. + * Otherwise, the number of repetitions is + * omitted. * @info_mask_separate: What information is to be exported that is specific to * this channel. * @info_mask_shared_by_type: What information is to be exported that is shared @@ -219,6 +225,7 @@ struct iio_chan_spec { u8 realbits; u8 storagebits; u8 shift; + u8 repeat; enum iio_endian endianness; } scan_type; long info_mask_separate; -- cgit v1.2.3