stm32mp1: ram: fix address issue in 2 tests

If user choose to test memory size is 1GByte (0x40000000),
memory address would overflow in test "Random" and
test "FrequencySelectivePattern".
Thus the system would hangs up when running DDR test.

Signed-off-by: Patrick Delaunay <patrick.delaunay@st.com>
Signed-off-by: Bossen WU <bossen.wu@st.com>

1 files changed, 14 insertions, 11 deletions

diff --git a/drivers/ram/stm32mp1/stm32mp1_tests.c b/drivers/ram/stm32mp1/stm32mp1_tests.c
index b6fb2a9c587..691c63c3ae0 100644
--- a/drivers/ram/stm32mp1/stm32mp1_tests.c
+++ b/drivers/ram/stm32mp1/stm32mp1_tests.c
@@ -578,27 +578,29 @@ static enum test_result test_random(struct stm32mp1_ddrctl *ctl,
 	u32 error = 0;
 	unsigned int seed;
 
-	if (get_bufsize(string, argc, argv, 0, &bufsize, 4 * 1024))
+	if (get_bufsize(string, argc, argv, 0, &bufsize, 8 * 1024))
 		return TEST_ERROR;
 	if (get_nb_loop(string, argc, argv, 1, &nb_loop, 1))
 		return TEST_ERROR;
 	if (get_addr(string, argc, argv, 2, &addr))
 		return TEST_ERROR;
 
-	printf("running %d loops at 0x%x\n", nb_loop, addr);
+	bufsize /= 2;
+	printf("running %d loops copy from 0x%x to 0x%x (buffer size=0x%x)\n",
+	       nb_loop, addr, addr + bufsize, bufsize);
 	while (!error) {
 		seed = rand();
-		for (offset = addr; offset < addr + bufsize; offset += 4)
-			writel(rand(), offset);
+		for (offset = 0; offset < bufsize; offset += 4)
+			writel(rand(), addr + offset);
 
 		memcpy((void *)addr + bufsize, (void *)addr, bufsize);
 
 		srand(seed);
-		for (offset = addr; offset < addr + 2 * bufsize; offset += 4) {
-			if (offset == (addr + bufsize))
+		for (offset = 0; offset < 2 * bufsize; offset += 4) {
+			if (offset == bufsize)
 				srand(seed);
 			value = rand();
-			error = check_addr(offset, value);
+			error = check_addr(addr + offset, value);
 			if (error)
 				break;
 			if (progress(offset))
@@ -607,6 +609,7 @@ static enum test_result test_random(struct stm32mp1_ddrctl *ctl,
 		if (test_loop_end(&loop, nb_loop, 100))
 			break;
 	}
+	putc('\n');
 
 	if (error) {
 		sprintf(string,
@@ -791,9 +794,9 @@ static enum test_result test_loop(const u32 *pattern, u32 *address,
 	int i;
 	int j;
 	enum test_result res = TEST_PASSED;
-	u32 *offset, testsize, remaining;
+	u32 offset, testsize, remaining;
 
-	offset = address;
+	offset = (u32)address;
 	remaining = bufsize;
 	while (remaining) {
 		testsize = bufsize > 0x1000000 ? 0x1000000 : bufsize;
@@ -809,7 +812,7 @@ static enum test_result test_loop(const u32 *pattern, u32 *address,
 		__asm__("stmia r1!, {R3-R10}");
 		__asm__("stmia r1!, {R3-R10}");
 		__asm__("stmia r1!, {R3-R10}");
-		__asm__("subs r2, r2, #8");
+		__asm__("subs r2, r2, #128");
 		__asm__("bge loop2");
 		__asm__("pop {R0-R10}");
 
@@ -1388,7 +1391,7 @@ const struct test_desc test[] = {
 	 "Verifies r/w and memcopy(burst for pseudo random value.",
 	 3
 	},
-	{test_freq_pattern, "FrequencySelectivePattern ", "[size]",
+	{test_freq_pattern, "FrequencySelectivePattern", "[size]",
 	 "write & test patterns: Mostly Zero, Mostly One and F/n",
 	 1
 	},