diff options
| author | Simon Glass | 2020-07-07 13:11:48 -0600 |
|---|---|---|
| committer | Bin Meng | 2020-07-17 14:32:24 +0800 |
| commit | 31e1787ec15e4a498e940e9ba24b625ca059a3b2 (patch) | |
| tree | 46143d89aa1acaf4b2081384ea0540823cd096ca /test/dm/acpigen.c | |
| parent | 4ebc940b39b6a43de9d1fa74653321cd6fdb4d3a (diff) | |
acpi: Support generation of I2C descriptor
Add a function to write a GPIO descriptor to the generated ACPI code.
Signed-off-by: Simon Glass <sjg@chromium.org>
Reviewed-by: Wolfgang Wallner <wolfgang.wallner@br-automation.com>
Reviewed-by: Bin Meng <bmeng.cn@gmail.com>
Diffstat (limited to 'test/dm/acpigen.c')
| -rw-r--r-- | test/dm/acpigen.c | 32 |
1 files changed, 32 insertions, 0 deletions
diff --git a/test/dm/acpigen.c b/test/dm/acpigen.c index 7d81652295e..c210ceb404c 100644 --- a/test/dm/acpigen.c +++ b/test/dm/acpigen.c @@ -276,3 +276,35 @@ static int dm_test_acpi_interrupt_or_gpio(struct unit_test_state *uts) } DM_TEST(dm_test_acpi_interrupt_or_gpio, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); + +/* Test emitting an I2C descriptor */ +static int dm_test_acpi_i2c(struct unit_test_state *uts) +{ + struct acpi_ctx *ctx; + struct udevice *dev; + u8 *ptr; + + ut_assertok(alloc_context(&ctx)); + + ptr = acpigen_get_current(ctx); + + ut_assertok(uclass_get_device(UCLASS_RTC, 0, &dev)); + ut_asserteq(0x43, acpi_device_write_i2c_dev(ctx, dev)); + ut_asserteq(28, acpigen_get_current(ctx) - ptr); + ut_asserteq(ACPI_DESCRIPTOR_SERIAL_BUS, ptr[0]); + ut_asserteq(25, get_unaligned((u16 *)(ptr + 1))); + ut_asserteq(ACPI_I2C_SERIAL_BUS_REVISION_ID, ptr[3]); + ut_asserteq(0, ptr[4]); + ut_asserteq(ACPI_SERIAL_BUS_TYPE_I2C, ptr[5]); + ut_asserteq(0, get_unaligned((u16 *)(ptr + 7))); + ut_asserteq(ACPI_I2C_TYPE_SPECIFIC_REVISION_ID, ptr[9]); + ut_asserteq(6, get_unaligned((u16 *)(ptr + 10))); + ut_asserteq(100000, get_unaligned((u32 *)(ptr + 12))); + ut_asserteq(0x43, get_unaligned((u16 *)(ptr + 16))); + ut_asserteq_str("\\_SB.I2C0", (char *)ptr + 18); + + free_context(&ctx); + + return 0; +} +DM_TEST(dm_test_acpi_i2c, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); |