diff options
| author | Simon Glass | 2014-07-23 06:55:18 -0600 |
|---|---|---|
| committer | Simon Glass | 2014-07-23 14:08:36 +0100 |
| commit | 1ca7e2062b4e8c3b211753dcb19c063b5b9b73ca (patch) | |
| tree | 09873667a133ba84aed32e5b44cfcd08353d1138 /doc/driver-model | |
| parent | 0040b9442947d00a540f6e93742384a14453c37e (diff) | |
dm: Provide a function to scan child FDT nodes
At present only root nodes in the device tree are scanned for devices.
But some devices can have children. For example a SPI bus may have
several children for each of its chip selects.
Add a function which scans subnodes and binds devices for each one. This
can be used for the root node scan also, so change it.
A device can call this function in its bind() or probe() methods to bind
its children.
Signed-off-by: Simon Glass <sjg@chromium.org>
Diffstat (limited to 'doc/driver-model')
| -rw-r--r-- | doc/driver-model/README.txt | 6 |
1 files changed, 5 insertions, 1 deletions
diff --git a/doc/driver-model/README.txt b/doc/driver-model/README.txt index 672497d4822..a2b6122ebcb 100644 --- a/doc/driver-model/README.txt +++ b/doc/driver-model/README.txt @@ -95,9 +95,13 @@ are provided in test/dm. To run them, try: You should see something like this: <...U-Boot banner...> - Running 17 driver model tests + Running 18 driver model tests Test: dm_test_autobind Test: dm_test_autoprobe + Test: dm_test_bus_children + Device 'd-test': seq 3 is in use by 'b-test' + Device 'c-test@0': seq 0 is in use by 'a-test' + Device 'c-test@1': seq 1 is in use by 'd-test' Test: dm_test_children Test: dm_test_fdt Device 'd-test': seq 3 is in use by 'b-test' |