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authorSimon Glass2015-03-25 12:23:05 -0600
committerSimon Glass2015-04-18 11:11:30 -0600
commite00cb2232b0e6c2f41f49f3535a7874067a60c3a (patch)
treeb99b179bbb759b99a172201784b9086704ec1226 /test/dm
parent57f54d55bdf7a21034182cf213c1084df214d98c (diff)
dm: usb: Add tests for the USB uclass
This adds a simple test for probing and a functional test using the flash stick emulator, which tests a large chunk of the USB stack. Signed-off-by: Simon Glass <sjg@chromium.org> Reviewed-by: Marek Vasut <marex@denx.de>
Diffstat (limited to 'test/dm')
-rw-r--r--test/dm/Makefile1
-rwxr-xr-xtest/dm/test-dm.sh3
-rw-r--r--test/dm/test.dts41
-rw-r--r--test/dm/usb.c50
4 files changed, 95 insertions, 0 deletions
diff --git a/test/dm/Makefile b/test/dm/Makefile
index a2e2d2328e3..fd9e29f201c 100644
--- a/test/dm/Makefile
+++ b/test/dm/Makefile
@@ -23,4 +23,5 @@ obj-$(CONFIG_DM_I2C) += i2c.o
obj-$(CONFIG_DM_PCI) += pci.o
obj-$(CONFIG_DM_SPI_FLASH) += sf.o
obj-$(CONFIG_DM_SPI) += spi.o
+obj-$(CONFIG_DM_USB) += usb.o
endif
diff --git a/test/dm/test-dm.sh b/test/dm/test-dm.sh
index 8ebc39297cb..6158f6833f9 100755
--- a/test/dm/test-dm.sh
+++ b/test/dm/test-dm.sh
@@ -10,5 +10,8 @@ dtc -I dts -O dtb test/dm/test.dts -o test/dm/test.dtb
make O=sandbox sandbox_config || die "Cannot configure U-Boot"
make O=sandbox -s -j${NUM_CPUS} || die "Cannot build U-Boot"
dd if=/dev/zero of=spi.bin bs=1M count=2
+echo -n "this is a test" > testflash.bin
+dd if=/dev/zero bs=1M count=4 >>testflash.bin
./sandbox/u-boot -d test/dm/test.dtb -c "dm test"
rm spi.bin
+rm testflash.bin
diff --git a/test/dm/test.dts b/test/dm/test.dts
index 0ab0916858a..d0c40be6b0a 100644
--- a/test/dm/test.dts
+++ b/test/dm/test.dts
@@ -20,6 +20,9 @@
testfdt8 = "/a-test";
eth0 = "/eth@10002000";
eth5 = &eth_5;
+ usb0 = &usb_0;
+ usb1 = &usb_1;
+ usb2 = &usb_2;
};
uart0: serial {
@@ -186,4 +189,42 @@
fake-host-hwaddr = <0x00 0x00 0x66 0x44 0x22 0x22>;
};
+ usb_0: usb@0 {
+ compatible = "sandbox,usb";
+ status = "disabled";
+ hub {
+ compatible = "sandbox,usb-hub";
+ #address-cells = <1>;
+ #size-cells = <0>;
+ flash-stick {
+ reg = <0>;
+ compatible = "sandbox,usb-flash";
+ };
+ };
+ };
+
+ usb_1: usb@1 {
+ compatible = "sandbox,usb";
+ hub {
+ compatible = "usb-hub";
+ usb,device-class = <9>;
+ hub-emul {
+ compatible = "sandbox,usb-hub";
+ #address-cells = <1>;
+ #size-cells = <0>;
+ flash-stick {
+ reg = <0>;
+ compatible = "sandbox,usb-flash";
+ sandbox,filepath = "testflash.bin";
+ };
+
+ };
+ };
+ };
+
+ usb_2: usb@2 {
+ compatible = "sandbox,usb";
+ status = "disabled";
+ };
+
};
diff --git a/test/dm/usb.c b/test/dm/usb.c
new file mode 100644
index 00000000000..6ea86d72472
--- /dev/null
+++ b/test/dm/usb.c
@@ -0,0 +1,50 @@
+/*
+ * Copyright (C) 2015 Google, Inc
+ *
+ * SPDX-License-Identifier: GPL-2.0+
+ */
+
+#include <common.h>
+#include <dm.h>
+#include <usb.h>
+#include <asm/io.h>
+#include <dm/test.h>
+#include <dm/ut.h>
+
+/* Test that sandbox USB works correctly */
+static int dm_test_usb_base(struct dm_test_state *dms)
+{
+ struct udevice *bus;
+
+ ut_asserteq(-ENODEV, uclass_get_device_by_seq(UCLASS_USB, 0, &bus));
+ ut_assertok(uclass_get_device(UCLASS_USB, 0, &bus));
+ ut_asserteq(-ENODEV, uclass_get_device_by_seq(UCLASS_USB, 2, &bus));
+
+ return 0;
+}
+DM_TEST(dm_test_usb_base, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
+
+/*
+ * Test that we can use the flash stick. This is more of a functional test. It
+ * covers scanning the bug, setting up a hub and a flash stick and reading
+ * data from the flash stick.
+ */
+static int dm_test_usb_flash(struct dm_test_state *dms)
+{
+ struct udevice *dev;
+ block_dev_desc_t *dev_desc;
+ char cmp[1024];
+
+ ut_assertok(usb_init());
+ ut_assertok(uclass_get_device(UCLASS_MASS_STORAGE, 0, &dev));
+ ut_assertok(get_device("usb", "0", &dev_desc));
+
+ /* Read a few blocks and look for the string we expect */
+ ut_asserteq(512, dev_desc->blksz);
+ memset(cmp, '\0', sizeof(cmp));
+ ut_asserteq(2, dev_desc->block_read(dev_desc->dev, 0, 2, cmp));
+ ut_assertok(strcmp(cmp, "this is a test"));
+
+ return 0;
+}
+DM_TEST(dm_test_usb_flash, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);