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/* SPDX-License-Identifier: GPL-2.0+ */
/*
* Copyright (c) 2013 Google, Inc.
*/
#ifndef __TEST_TEST_H
#define __TEST_TEST_H
#include <malloc.h>
#include <linux/bitops.h>
/*
* struct unit_test_state - Entire state of test system
*
* @fail_count: Number of tests that failed
* @start: Store the starting mallinfo when doing leak test
* @of_live: true to use livetree if available, false to use flattree
* @of_root: Record of the livetree root node (used for setting up tests)
* @root: Root device
* @testdev: Test device
* @force_fail_alloc: Force all memory allocs to fail
* @skip_post_probe: Skip uclass post-probe processing
* @expect_str: Temporary string used to hold expected string value
* @actual_str: Temporary string used to hold actual string value
*/
struct unit_test_state {
int fail_count;
struct mallinfo start;
struct device_node *of_root;
bool of_live;
struct udevice *root;
struct udevice *testdev;
int force_fail_alloc;
int skip_post_probe;
char expect_str[256];
char actual_str[256];
};
/* Test flags for each test */
enum {
UT_TESTF_SCAN_PDATA = BIT(0), /* test needs platform data */
UT_TESTF_PROBE_TEST = BIT(1), /* probe test uclass */
UT_TESTF_SCAN_FDT = BIT(2), /* scan device tree */
UT_TESTF_FLAT_TREE = BIT(3), /* test needs flat DT */
UT_TESTF_LIVE_TREE = BIT(4), /* needs live device tree */
UT_TESTF_CONSOLE_REC = BIT(5), /* needs console recording */
/* do extra driver model init and uninit */
UT_TESTF_DM = BIT(6),
};
/**
* struct unit_test - Information about a unit test
*
* @name: Name of test
* @func: Function to call to perform test
* @flags: Flags indicated pre-conditions for test
*/
struct unit_test {
const char *file;
const char *name;
int (*func)(struct unit_test_state *state);
int flags;
};
/**
* UNIT_TEST() - create linker generated list entry for unit a unit test
*
* The macro UNIT_TEST() is used to create a linker generated list entry. These
* list entries are enumerate tests that can be execute using the ut command.
* The list entries are used both by the implementation of the ut command as
* well as in a related Python test.
*
* For Python testing the subtests are collected in Python function
* generate_ut_subtest() by applying a regular expression to the lines of file
* u-boot.sym. The list entries have to follow strict naming conventions to be
* matched by the expression.
*
* Use UNIT_TEST(foo_test_bar, _flags, foo_test) for a test bar in test suite
* foo that can be executed via command 'ut foo bar' and is implemented in
* function foo_test_bar().
*
* @_name: concatenation of name of the test suite, "_test_", and the name
* of the test
* @_flags: an integer field that can be evaluated by the test suite
* implementation
* @_suite: name of the test suite concatenated with "_test"
*/
#define UNIT_TEST(_name, _flags, _suite) \
ll_entry_declare(struct unit_test, _name, _suite) = { \
.file = __FILE__, \
.name = #_name, \
.flags = _flags, \
.func = _name, \
}
/* Get the start of a list of unit tests for a particular category */
#define UNIT_TEST_SUITE_START(_suite) \
ll_entry_start(struct unit_test, _suite)
#define UNIT_TEST_SUITE_COUNT(_suite) \
ll_entry_count(struct unit_test, _suite)
/* Sizes for devres tests */
enum {
TEST_DEVRES_SIZE = 100,
TEST_DEVRES_COUNT = 10,
TEST_DEVRES_TOTAL = TEST_DEVRES_SIZE * TEST_DEVRES_COUNT,
/* A few different sizes */
TEST_DEVRES_SIZE2 = 15,
TEST_DEVRES_SIZE3 = 37,
};
/**
* testbus_get_clear_removed() - Test function to obtain removed device
*
* This is used in testbus to find out which device was removed. Calling this
* function returns a pointer to the device and then clears it back to NULL, so
* that a future test can check it.
*/
struct udevice *testbus_get_clear_removed(void);
/**
* dm_test_run() - Run driver model tests
*
* Run all the available driver model tests, or a selection
*
* @test_name: Name of single test to run (e.g. "dm_test_fdt_pre_reloc" or just
* "fdt_pre_reloc"), or NULL to run all
* @return 0 if all tests passed, 1 if not
*/
int dm_test_run(const char *test_name);
#endif /* __TEST_TEST_H */
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