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/*
* Copyright (C) 2013 Google, Inc
*
* SPDX-License-Identifier: GPL-2.0+
*/
#include <common.h>
#include <dm.h>
#include <fdtdec.h>
#include <spi.h>
#include <spi_flash.h>
#include <asm/state.h>
#include <dm/test.h>
#include <dm/util.h>
#include <test/ut.h>
/* Test that sandbox SPI flash works correctly */
static int dm_test_spi_flash(struct unit_test_state *uts)
{
/*
* Create an empty test file and run the SPI flash tests. This is a
* long way from being a unit test, but it does test SPI device and
* emulator binding, probing, the SPI flash emulator including
* device tree decoding, plus the file-based backing store of SPI.
*
* More targeted tests could be created to perform the above steps
* one at a time. This might not increase test coverage much, but
* it would make bugs easier to find. It's not clear whether the
* benefit is worth the extra complexity.
*/
ut_asserteq(0, run_command_list(
"sb save hostfs - 0 spi.bin 200000;"
"sf probe;"
"sf test 0 10000", -1, 0));
/*
* Since we are about to destroy all devices, we must tell sandbox
* to forget the emulation device
*/
sandbox_sf_unbind_emul(state_get_current(), 0, 0);
return 0;
}
DM_TEST(dm_test_spi_flash, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
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